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Short-range atomic order in the surface layer of sputter-deposited Al0.6W0.4 thin film investigated using directional elastic peak electron spectroscopy.
Autorzy
Rok wydania
2006
Czasopismo
Journal of Non-Crystalline Solids
Numer woluminu
352
Strony
2811-2817
DOI
10.1016/j.jnoncrysol.2006.03.057
Kolekcja
Język
Angielski
Typ publikacji
Artykuł
A mechanism of creating maxima in directional elastic peak electron spectroscopy (DEPES) polar profiles for textured polycrystalline
samples and for amorphous samples with a short-range atomic order is proposed and discussed. DEPES was used in investigating the
atomic order in Al and W polycrystalline samples. The maxima found in DEPES polar profiles correspond with the texture expected for
these samples on the basis of literature data. A method of processing DEPES data of amorphous metallic alloy with a short-range atomic order is proposed and successfully used for an Al0.6W0.4 alloy. The results obtained indicate that nanocrystals with an average linear size in the range of 1 nm and with a particular orientation with respect to the sample surface are present in the surface layer of the sample investigated. A concentration of nanocrystals with such orientation equal to 1.9 · 1019/cm3 was found when using of the contrast obtained for the maximum in the DEPES polar profile, corresponding to an incidence angle of zero. The contrast of DEPES profiles for the Al0.6W0.4 sample increases remarkably during annealing at 373 K. An increase in the amount of preferentially-oriented nanocrystals is suggested as the probable reason for this increase.
Słowa kluczowe
Alloys, Crystals, Directional elastic peak electron spectroscopy, Short-range atomic order
Adres publiczny
https://doi.org/10.1016/j.jnoncrysol.2006.03.057
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